Magdy S. Abadir: search on Z-Library

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1

A Knowledge-Based System for Designing Testable VLSI Chips

Abadir, Magdy, Breuer, Melvin

Journal:

IEEE Design & Test of Computers

Year:

1985

Language:

english

File:

PDF, 14.50 MB

english, 1985

2

Multichip systems trade-off analysis tool

Peter A. Sandborn, Rajarshi Ghosh, Ken Drake, Magdy Abadir, Linda Bal, Ashish Parikh

Journal:

Journal of Electronic Testing

Year:

1994

Language:

english

File:

PDF, 1.09 MB

english, 1994

3

High Level Test Economics Advisor (Hi-TEA)

Magdy Abadir, Ashish Parikh, Linda Bal, Peter Sandborn, Cynthia Murphy

Journal:

Journal of Electronic Testing

Year:

1994

Language:

english

File:

PDF, 1023 KB

english, 1994

4

Introduction

Magdy Abadir, Tony Ambler

Journal:

Journal of Electronic Testing

Year:

1994

Language:

english

File:

PDF, 117 KB

english, 1994

5

Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG

Andreas Veneris, Robert Chang, Magdy S. Abadir, Sep Seyedi

Journal:

Journal of Electronic Testing

Year:

2005

Language:

english

File:

PDF, 861 KB

english, 2005

6

Intraoperative wake-up test in neonatal neurosurgery

RAMASAMY GOVINDARAJAN, OLUWASEUN BABALOLA, MAGDY GAD-EL-KAREEM, NAGENDRA S KODALI, JUDITH ARONSON, ADEL ABADIR

Journal:

Pediatric Anesthesia

Year:

2006

Language:

english

File:

PDF, 49 KB

english, 2006

7

Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die

Cynthia F. Murphy, Magdy S. Abadir, Peter A. Sandborn

Journal:

Journal of Electronic Testing

Year:

1997

Language:

english

File:

PDF, 227 KB

english, 1997

8

Guest Editorial

Journal:

Journal of Electronic Testing

Year:

2000

Language:

english

File:

PDF, 11 KB

english, 2000

9

Test Generation Based on High-Level Assertion Specification for PowerPCTM Microprocessor Embedded Arrays

Li-C. Wang, Magdy S. Abadir

Journal:

Journal of Electronic Testing

Year:

1998

Language:

english

File:

PDF, 164 KB

english, 1998

10

Experience in Validation of PowerPCTM Microprocessor Embedded Arrays

Li-C. Wang, Magdy S. Abadir

Journal:

Journal of Electronic Testing

Year:

1999

Language:

english

File:

PDF, 450 KB

english, 1999

11

On Efficiently Producing Quality Tests for Custom Circuits in PowerPC™ Microprocessors

Li-C. Wang, Magdy S. Abadir

Journal:

Journal of Electronic Testing

Year:

2000

Language:

english

File:

PDF, 105 KB

english, 2000

12

Oscillation Ring Delay Test for High Performance Microprocessors

Wen Ching Wu, Chung Len Lee, Ming Shae Wu, Jwu E. Chen, Magdy S. Abadir

Journal:

Journal of Electronic Testing

Year:

2000

Language:

english

File:

PDF, 115 KB

english, 2000

13

Formal Verification Successes at Motorola

Magdy S. Abadir, Kenneth L. Albin, John Havlicek, Narayanan Krishnamurthy, Andrew K. Martin

Journal:

Formal Methods in System Design

Year:

2003

Language:

english

File:

PDF, 55 KB

english, 2003

14

Synthesis and characterization of laminated Si/SiC composites

Naga, Salma M., Kenawy, Sayed H., Awaad, Mohamed, Abd El-Wahab, Hamada S., Greil, Peter, Abadir, Magdi F.

Journal:

Journal of Advanced Research

Year:

2013

Language:

english

File:

PDF, 1.26 MB

english, 2013

15

[ACM Press the 41st annual conference - San Diego, CA, USA (2004.06.07-2004.06.11)] Proceedings of the 41st annual conference on Design automation - DAC '04 - On path-based learning and its applications in delay test and diagnosis

Wang, Li-C., Mak, T. M., Cheng, Kwang-Ting, Abadir, Magdy S.

Year:

2004

Language:

english

File:

PDF, 437 KB

english, 2004

16

[ACM Press the 50th Annual Design Automation Conference - Austin, Texas (2013.05.29-2013.06.07)] Proceedings of the 50th Annual Design Automation Conference on - DAC '13 - Simulation knowledge extraction and reuse in constrained random processor verification

Chen, Wen, Wang, Li-Chung, Bhadra, Jay, Abadir, Magdy

Year:

2013

Language:

english

File:

PDF, 835 KB

english, 2013

17

Guest Editorial: Test and Verification Challenges for Future Microprocessors and SoC Designs

Ray, Sandip, Bhadra, Jay, Abadir, Magdy S., Wang, Li-C

Journal:

Journal of Electronic Testing

Year:

2013

Language:

english

File:

PDF, 144 KB

english, 2013

18

[ACM Press the 2003 conference - Kitakyushu, Japan (2003.01.21-2003.01.24)] Proceedings of the 2003 conference on Asia South Pacific design automation - ASPDAC - An automated method for test model generation from switch level circuits

McDougall, Tim, Parashkevov, Atanas, Jolly, Simon, Zhu, Juhong, Zeng, Jing, Pyron, Carol, Abadir, Magdy

Year:

2003

Language:

english

File:

PDF, 114 KB

english, 2003

19

[IEEE 2010 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Anaheim, FL, USA (2010.06.10-2010.06.12)] 2010 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Coverage metrics for verification of concurrent SystemC designs using mutation testing

Sen, Alper, Abadir, Magdy S.

Year:

2010

Language:

english

File:

PDF, 520 KB

english, 2010

20

[IEEE 2006 IEEE International SOC Conference - Austin, TX (2006.09.24-2006.09.27)] 2006 IEEE International SOC Conference - A Trace-Driven Validation Methodology for Multi-Processor SOCS

Bhadra, Jayanta, Trofimova, Ekaterina, Giordano, Leonard, Abadir, Magdy

Year:

2006

Language:

english

File:

PDF, 5.42 MB

english, 2006

21

[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Understanding customer returns from a test perspective

Sumikawa, Nik, Drmanac, Dragoljub, Wang, Li-C., Winemberg, LeRoy, Abadir, Magdy S.

Year:

2011

Language:

english

File:

PDF, 1.19 MB

english, 2011

22

[IEEE 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) - Istanbul, Turkey (2013.10.7-2013.10.9)] 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) - Keynote 1 — VLSI 2.0: R&D Post Moore

Nassif, Sani, Patt, Yale, Abadir, Magdy

Year:

2013

File:

PDF, 196 KB

2013

23

[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Multivariate outlier modeling for capturing customer returns — How simple it can be

Tikkanen, Jeff, Sumikawa, Nik, Wang, Li-C., Abadir, Magdy S.

Year:

2014

Language:

english

File:

PDF, 2.82 MB

english, 2014

24

[IEEE 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Bangalore, India (2007.01.6-2007.01.10)] 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - STEFAL: A System Level Temperature- and Floorplan-Aware Leakage Power Estimator for SoCs

Gupta, Aseem, Dutt, Nikil, Kurdahi, Fadi, Khouri, Kamal, Abadir, Magdy

Year:

2007

Language:

english

File:

PDF, 392 KB

english, 2007

25

[IEEE Seventh International Workshop on Microprocessor Test and Verification (MTV'06) - Austin, TX, USA (2006.12.4-2006.12.5)] Seventh International Workshop on Microprocessor Test and Verification (MTV'06) - Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study

Koo, Heon-Mo, Mishra, Prabhat, Bhadra, Jayanta, Abadir, Magdy

Year:

2006

Language:

english

File:

PDF, 259 KB

english, 2006

26

[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Forward prediction based on wafer sort data — A case study

Sumikawa, Nik, Drmanac, D. Gagi, Wang, Li-C., Winemberg, LeRoy, Abadir, Magdy S.

Year:

2011

Language:

english

File:

PDF, 11.97 MB

english, 2011

27

[IEEE 2005 Sixth International Workshop on Microprocessor Test and Verification - Austin, TX, USA (2005.11.3-2005.11.3)] 2005 Sixth International Workshop on Microprocessor Test and Verification - Post-Verification Debugging of Hierarchical Designs

Ali, Moayad, Safarpour, Sean, Veneris, Andreas, Abadir, Magdy, Drechsler, Rolf

Year:

2006

Language:

english

File:

PDF, 243 KB

english, 2006

28

[IEEE 4th International Workshop on Microprocessor Test and Verification - Common Challenges and Solutions - Austin, TX, USA (29-30 May 2003)] Proceedings. 4th International Workshop on Microprocessor Test and Verification - Common Challenges and Solutions - A methodology for validating manufacturing test vector suites for custom designed scan-based circuits

Jayanta Bhadra,, Narayanan Krishnamurthy,, Magdy Abadir,

Year:

2003

File:

PDF, 2.61 MB

2003

29

[IEEE 2005 Sixth International Workshop on Microprocessor Test and Verification - Austin, TX, USA (2005.11.3-2005.11.3)] 2005 Sixth International Workshop on Microprocessor Test and Verification - Retiming Verification Using Sequential Equivalence Checking

Kahne, Brian, Abadir, Magdy

Year:

2006

Language:

english

File:

PDF, 122 KB

english, 2006

30

[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Thermal Aware Global Routing of VLSI Chips for Enhanced Reliability

Gupta, Aseem, Dutt, Nikil D., Kurdahi, Fadi J., Khouri, Kamal S., Abadir, Magdy S.

Year:

2008

Language:

english

File:

PDF, 427 KB

english, 2008

31

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Analyzing the risk of timing modeling based on path delay tests.

Bastani, Pouria, Lee, Benjamin N., Wang, Li-C., Sundareswaran, Savithri, Abadir, Magdy S.

Year:

2007

Language:

english

File:

PDF, 259 KB

english, 2007

32

[IEEE 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2008.04.23-2008.04.25)] 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - An improved feature ranking method for diagnosis of systematic timing uncertainty

Bastani, Pouria, Callegari, Nicholas, Wang, Li-C., Abadir, Magdy

Year:

2008

Language:

english

File:

PDF, 226 KB

english, 2008

33

[IEEE 2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2009.04.28-2009.04.30)] 2009 International Symposium on VLSI Design, Automation and Test - On chip Communication-Architecture Based Thermal Management for SoCs

Gupta, Aseem, Pasricha, Sudeep, Dutt, Nikil, Kurdahi, Fadi, Khouri, Kamal, Abadir, Magdy

Year:

2009

Language:

english

File:

PDF, 292 KB

english, 2009

34

[IEEE 2005 Sixth International Workshop on Microprocessor Test and Verification - Austin, TX, USA (2005.11.3-2005.11.3)] 2005 Sixth International Workshop on Microprocessor Test and Verification - Automatic Generation of High Performance Embedded Memory Models for PowerPC Microprocessors

Bhadra, Jayanta, Abadir, Magdy, Burgess, David, Trofimova, Ekaterina

Year:

2006

Language:

english

File:

PDF, 169 KB

english, 2006

35

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Screening customer returns with multivariate test analysis

Sumikawa, Nik, Tikkanen, Jeff, Wang, Li-C., Winemberg, LeRoy, Abadir, Magdy S.

Year:

2012

Language:

english

File:

PDF, 2.79 MB

english, 2012

36

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Issues on Test Optimization with Known Good Dies and Known Defective Dies ¿ A Statistical Perspective

Lee, Benjamin, Wang, Li-c., Abadir, Magdy

Year:

2006

Language:

english

File:

PDF, 11.83 MB

english, 2006

37

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - An experiment of burn-in time reduction based on parametric test analysis

Sumikawa, Nik, Wang, Li-C., Abadir, Magdy S.

Year:

2012

Language:

english

File:

PDF, 756 KB

english, 2012

38

[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - A pattern mining framework for inter-wafer abnormality analysis

Sumikawa, Nik, Wang, Li-C., Abadir, Magdy S.

Year:

2013

Language:

english

File:

PDF, 3.27 MB

english, 2013

39

[IEEE 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Rabat, Morocco (2007.09.2-2007.09.5)] 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Meeting the evolving challenges of the semiconductor industry

Abadir, Magdy S.

Year:

2007

Language:

english

File:

PDF, 263 KB

english, 2007

40

[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Maximum Circuit Activity Estimation Using Pseudo-Boolean Satisfiability

Mangassarian, Hratch, Veneris, Andreas, Safarpour, Sean, Najm, Farid N., Abadir, Magdy S.

Year:

2007

Language:

english

File:

PDF, 252 KB

english, 2007

41

[IEEE 2007 Asia and South Pacific Design Automation Conference - Yokohama, Japan (2007.01.23-2007.01.26)] 2007 Asia and South Pacific Design Automation Conference - LEAF: A System Level Leakage-Aware Floorplanner for SoCs

Gupta, Aseem, Dutt, Nikil D., Kurdahi, Fadi J., Khouri, Kamal S., Abadir, Magdy S.

Year:

2007

Language:

english

File:

PDF, 269 KB

english, 2007

42

[IEEE 2006 IEEE International High Level Design Validation and Test Workshop - Monterey, CA, USA (2006.11.8-2006.11.10)] 2006 IEEE International High Level Design Validation and Test Workshop - Extracting a simplified view of design functionality via vector simulation

Guzey, Onur, Wen, Charles, Wang, Li-C., Feng, Tao, Abadir, Magdy

Year:

2006

Language:

english

File:

PDF, 10.46 MB

english, 2006

43

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Statistical analysis and optimization of parametric delay test

Wu, Sean H., Lee, Benjamin N., Wang, Li-C., Abadir, Magdy S.

Year:

2007

Language:

english

File:

PDF, 702 KB

english, 2007

44

Calcination of sodium-calcium carbonates in air

Gadalla, Ahmed M., Abadir, Magdi F.

Journal:

Industrial & Engineering Chemistry Fundamentals

Year:

1984

Language:

english

File:

PDF, 531 KB

english, 1984

45

[IEEE 2014 9th International Conference on Computer Engineering & Systems (ICCES) - Cairo, Egypt (2014.12.22-2014.12.23)] 2014 9th International Conference on Computer Engineering & Systems (ICCES) - Plenary talk I: data mining-based prediction paradigm and its applications in design automation

Abadir, Magdy S.

Year:

2014

Language:

english

File:

PDF, 561 KB

english, 2014

46

[ACM Press the 2nd IEEE/ACM/IFIP international conference - Stockholm, Sweden (2004.09.08-2004.09.10)] Proceedings of the 2nd IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis - CODES+ISSS '04 - Analytical models for leakage power estimation of memory array structures

Mamidipaka, Mahesh, Khouri, Kamal, Dutt, Nikil, Abadir, Magdy

Year:

2004

Language:

english

File:

PDF, 239 KB

english, 2004

47

[ACM Press the 15th ACM Great Lakes symposium - Chicago, Illinois, USA (2005.04.17-2005.04.19)] Proceedings of the 15th ACM Great Lakes symposium on VLSI - GLSVSLI '05 - Diagnosing multiple transition faults in the absence of timing information

Liu, Jiang Brandon, Abadir, Magdy, Veneris, Andreas, Safarpour, Sean

Year:

2005

Language:

english

File:

PDF, 121 KB

english, 2005

48

On measuring the effectiveness of various design validation approaches for PowerPC microprocessor embedded arrays

Wang, Li-C., Abadir, Magdy S., Zeng, Jing

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

1998

Language:

english

File:

PDF, 252 KB

english, 1998

49

Introduction to special section on verification challenges in the concurrent world

Ray, Sandip, Bhadra, Jayanta, Abadir, Magdy S., Wang, Li-C., Gupta, Aarti

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2012

Language:

english

File:

PDF, 42 KB

english, 2012

50

[ACM Press the 45th annual conference - Anaheim, California (2008.06.08-2008.06.13)] Proceedings of the 45th annual conference on Design automation - DAC '08 - Predictive runtime verification of multi-processor SoCs in SystemC

Sen, Alper, Ogale, Vinit, Abadir, Magdy S.

Year:

2008

Language:

english

File:

PDF, 521 KB

english, 2008

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